Blogs - Semiconductor
Why can’t the Semiconductor Industry afford to take its Eyes off SerDes?
In this era of pervasive connectivity, everything needs to communicate with each other and everything
Top 5 Solutions for Optimal DFT (Design for Testability) in Lower Technology Nodes
Design for Testability (DFT), is one of the effective ways to overcome power consumption challenges
Powering Design Innovations with Lower Technology Nodes at 7nm and Beyond [Infographic]
The developments in the past in chip design laid the foundation for lower technology nodes
ASIC Design Flow in VLSI Engineering Services – A Quick Guide
The journey of designing an ASIC (application specific integrated circuit) is long and involves a number of major steps – moving from a concept to specification to tape-outs. Although the end product is typically quite small (measured in nanometers), this long journey is interesting and filled with many engineering challenges.
How Formal Verification Alleviates the Dark Sides of RISC-V Cores?
Verification is the process of reviewing, inspecting, or testing hardware design in order to get
Signoff Iteration Reduction Technique for Fixing Top Level Antenna
While developing large-sized chips, “divide & conquer” techniques are used. This involves partitioning the design,
Memory Testing: MBIST, BIRA & BISR | An Insight into Algorithms and Self Repair Mechanism
Typically, we see a 4X increase in memory size every 3 years to cater to
How to Deliver On-Time at Lower Technology Nodes (7nm,10nm,16nm…)?
Over the years, we have seen a wide range of advancements in semiconductor design services.
A Heuristic Approach to Fix Design Rule Check (DRC) Violations in ASIC Designs @7nm FinFET Technology
The intent of this paper is to explain the varied kinds of DRCs (Design Rule