Top 5 Solutions for Optimal DFT (Design for Testability) in Lower Technology Nodes

DFT(Design for Testability) architecture enables engineers to make development and deployment of test infrastructure in a cost effective manner. Some solutions for effective DFT in lower technology nodes may include: 1. Reduced pin count testing 2. DFT Scan Insertion and compression 3. Low power design and management techniques in DFT 4. Handling of multiple fault categories, and 5. Test-point insertion for better test coverage.

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ABOUT THE AUTHOR

Komal Chauhan

Komal Chauhan works as a Digital Marketing Senior Executive at eInfochips where she supports digital marketing activities for various verticals - semiconductor and silicon engineering partnerships, DevOps, and Aerospace. She has 7+ years of experience in digital marketing which includes search engine optimization, content planning and management, inbound & social media marketing. She holds an engineering degree in Computer Science. Her hobbies include gaming, digital gadgets and traveling.

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