Memory Testing: MBIST, BIRA & BISR | An Insight into Algorithms and Self Repair Mechanism

Deep submicron devices contain a large number of memories which demands lower area and fast access time, hence, an automated test strategy for such designs is required to reduce ATE (Automatic Test Equipment) time and cost. Conventional DFT methods do not provide a complete solution to the requirement of testing memory faults and its self-repair capabilities. A promising solution to this dilemma is Memory BIST (Built-in Self-test) which adds test and repair circuitry to the memory itself and provides an acceptable yield.

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