Design for Testability (DFT) of a Motion Control MEMS ASIC

Executive Summary

A leading MEMS provider was looking for implementing Design for Testability (DFT) solution for its next-gen Digital Motion Control MEMs ASIC. This was an Advanced Driver Assistance Systems (ADAS). For safety, improved comfort, and personalized in-vehicle experiences, it contained a new 6-axis (3-axis accelerometer + 3-axis gyroscope) safety inertial sensor (the industry’s smallest size, which facilitates system miniaturization for safety applications, such as rollover detection and electronic stability control). This new safety inertial sensor, currently sampling, supports the most demanding low-bias drift, low-sensitivity drift, and high-vibration robustness performance requirements.

This 6-Axis Digital Motion Control MEMS is targeted for next-generation mobile devices. The evolution of mobile devices has led to multi-feature integration, including 3-axis accelerometer, 3-axis gyroscope, temperature sensor, signal processing, digital Motion Processor. This MEMS can plug and play with any compliant 3rd party sensors to increase on board processing power, memory size and general purpose IO and interrupt capabilities. This is very critical to address the market requirements of high-performance applications such as location-based services, remote health monitoring and sports and fitness tracking.

eInfochips provided complete assistance – right from defining the DFT architecture to providing post-silicon support for this MEMS.

Project Highlights

Design for Testability (DFT) of a Motion Control MEMS ASIC
  • Targeted for Advanced Driver Assistance System for Automotive
  • 6-Axis Gyroscope & Accelerometer
  • Varying from 55nm to 180nm
  • Design Complexity: 12K to 35K Flop Count, Single RAM, ROM & OTP
  • MBIST for RAM and ROM
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