Design for testability (DFT) and low power issues are very much related with each other. In this paper paper power reduction methodologies are discussed for a given design. Power management circuitries are developed to reduce functional power of the design. Power aware scan Chains are implemented to create test environment which result into reduction in test power. Design for testability is applied to test power management circuits using Power Test Access Mechanism. Also few methods are discussed to implement DFT to test power management circuitry and improve test and fault coverage during ATPG.